Ion Milling for Sample Preparation

A provider of microscopic analysis services for device quality assurance has added ion milling to its laboratory’s sample preparation capabilities. Ion milling is a method of sample preparation that complements the capabilities of traditional microscopy and metallographic laboratory techniques such as mechanical cross-sectioning, polishing, and chemical etching, delivering a high level of clarity with critical and difficult-to-prepare samples such as complex assemblies, tiny components, and device parts made from high-technology materials. It uses high-energy argon-ion bombardment to remove contamination or damaged material from the surface of samples 25 mm in diameter and smaller, and to polish or otherwise modify their surface prior to microscopic inspection. The service provider employs a computer-controlled ion-milling system to perform these functions and also to prepare cross sections by cutting through the sample with the argon-ion beam and thus reveal multilayer structures in medical-grade materials such as noble metals and corrosion-resistant alloys without distortion.

Materials Evaluation and Engineering Inc.

Plymouth, MN